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Scanning Tunneling Microscopy of Si Donors in GaAs
Zheng, Jun-Fei, Liu, X., Newman, N., Weber, Eicke R., Ogletree, D.F., Salmeron, M.B.Volume:
143-147
Year:
1994
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.143-147.1319
File:
PDF, 383 KB
1994