Scanning Tunneling Microscopy of Si Donors in GaAs

Zheng, Jun-Fei, Liu, X., Newman, N., Weber, Eicke R., Ogletree, D.F., Salmeron, M.B.

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Volume:

143-147

Year:

1994

Journal:

Materials Science Forum

DOI:

10.4028/www.scientific.net/MSF.143-147.1319

File:

PDF, 383 KB

1994

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