Hardware-Software Subsystem for MOSFETs Characteristic...

Advanced Materials Research 2013 / 7 Vol. 718-720

Hardware-Software Subsystem for MOSFETs Characteristic Measurement and Parameter Extraction with Account for Radiation Effects

Petrosyants, Konstantin O., Kharitonov, Igor A., Sambursky, Lev M.
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Volume:
718-720
Language:
english
Journal:
Advanced Materials Research
DOI:
10.4028/www.scientific.net/AMR.718-720.750
Date:
July, 2013
File:
PDF, 466 KB
english, 2013
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