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SPIE Proceedings [SPIE IS&T/SPIE's Symposium on Electronic Imaging: Science and Technology - San Jose, CA (Sunday 31 January 1993)] Machine Vision Applications in Industrial Inspection - Area parameters in machine vision: a sampling of multiple applications
Seitzler, Thomas M., Wu, Frederick Y., Dawson, Benjamin M.Volume:
1907
Year:
1993
Language:
english
DOI:
10.1117/12.144809
File:
PDF, 883 KB
english, 1993