Application of Improved Canny Algorithm on the IC Chip pin...

Advanced Materials Research 2011 / 8 Vol. 317-319

Application of Improved Canny Algorithm on the IC Chip pin Inspection

Huang, Ying, Pan, Qi, Liu, Qi, He, Xin Peng, Liu, Yun Feng, Yu, Yong Quan
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Volume:
317-319
Language:
english
Journal:
Advanced Materials Research
DOI:
10.4028/www.scientific.net/AMR.317-319.854
Date:
August, 2011
File:
PDF, 708 KB
english, 2011
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