[IEEE 2014 22nd International Conference on Pattern...

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[IEEE 2014 22nd International Conference on Pattern Recognition (ICPR) - Stockholm, Sweden (2014.8.24-2014.8.28)] 2014 22nd International Conference on Pattern Recognition - Boosting Stochastic Newton with Entropy Constraint for Large-Scale Image Classification

Ali, Wafa Bel Haj, Nock, Richard, Barlaud, Michel
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Year:
2014
Language:
english
DOI:
10.1109/ICPR.2014.49
File:
PDF, 220 KB
english, 2014
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