Analysis of Threshold Voltage Variance in 45nm N-Channel...

Advanced Materials Research 2014 / 2 Vol. 903

Analysis of Threshold Voltage Variance in 45nm N-Channel Device Using L27 Orthogonal Array Method

Salehuddin, Fauziyah, Zain, Anis Suhaila Mohd, Idris, Niza Mohd, Yamin, Ahmad Kamal Mat, Hamid, Afifah Maheran Abdul, Ahmad, Ibrahim, Menon, P. Susthitha
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Volume:
903
Language:
english
Journal:
Advanced Materials Research
DOI:
10.4028/www.scientific.net/AMR.903.297
Date:
February, 2014
File:
PDF, 303 KB
english, 2014
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