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First observation of in-plane X-ray diffraction arising from a single layered inorganic compound film by a grazing incidence X-ray diffraction system with a conventional laboratory X-ray source
Shin Takahashi, Masahiro Taniguchi, Kazuhiko Omote, Noboru Wakabayashi, Rina Tanaka, Akihiko YamagishiVolume:
352
Year:
2002
Language:
english
Pages:
7
DOI:
10.1016/s0009-2614(01)01446-4
File:
PDF, 195 KB
english, 2002