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Determination of Energy Level of Atomic H in Crystalline Silicon by Use of Hydrogenation of Radiation Defects
Du, Yong-Chang, Yan, Mao-Xun, Qin, Guo-GangVolume:
38-41
Year:
1989
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.38-41.1021
File:
PDF, 351 KB
1989