Interaction of Point Defects with Impurities in the Si-SiO2...

Solid State Phenomena 2009 / 10 Vol. 156-158

Interaction of Point Defects with Impurities in the Si-SiO2 System and its Influence on the Properties of the Interface

Kropman, Daniel, Mellikov, E., Lott, K., Kärner, T., Heinmaa, I., Laas, Tony, Medvid, Arthur, Skorupa, Wolfgang, Prucnal, S., Zvyagin, S., Cizmar, E., Ozerov, M., Woznitsa, J.
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Volume:
156-158
Language:
english
Journal:
Solid State Phenomena
DOI:
10.4028/www.scientific.net/SSP.156-158.145
Date:
October, 2009
File:
PDF, 661 KB
english, 2009
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