![](/img/cover-not-exists.png)
Interaction of Point Defects with Impurities in the Si-SiO2 System and its Influence on the Properties of the Interface
Kropman, Daniel, Mellikov, E., Lott, K., Kärner, T., Heinmaa, I., Laas, Tony, Medvid, Arthur, Skorupa, Wolfgang, Prucnal, S., Zvyagin, S., Cizmar, E., Ozerov, M., Woznitsa, J.Volume:
156-158
Language:
english
Journal:
Solid State Phenomena
DOI:
10.4028/www.scientific.net/SSP.156-158.145
Date:
October, 2009
File:
PDF, 661 KB
english, 2009