Non-Destructive, Large-Scale Imaging of Anti-Phase Disorder in GaP Epilayers on Si(001) Using Low-Energy Electron Microscopy
Borkenhagen, B., Doscher, H., Hannappel, T., Lilienkamp, G., Daum, W.Volume:
45
Language:
english
Journal:
ECS Transactions
DOI:
10.1149/1.3700472
Date:
April, 2012
File:
PDF, 1.33 MB
english, 2012