On the Influence of Doping and Annealing on Oxygen-Related Defects in Silicon
Mascher, Peter, Dannefaer, S., Kerr, D., Hahn, S.K.Volume:
10-12
Year:
1986
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.10-12.869
File:
PDF, 318 KB
1986