SPIE Proceedings [SPIE Photomask and Next Generation...

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SPIE Proceedings [SPIE Photomask and Next Generation Lithography Mask Technology VIII - Kanagawa, Japan (Wednesday 25 April 2001)] Photomask and Next-Generation Lithography Mask Technology VIII - Longevity of 193-nm/ArF excimer pellicle

Kozeki, Takashi, Shigematsu, Shigeto, Kondo, Masahiro, Nakagawa, Hiroaki, Kawahira, Hiroichi
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Volume:
4409
Year:
2001
Language:
english
DOI:
10.1117/12.438394
File:
PDF, 440 KB
english, 2001
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