Thermally induced failure mechanisms of organic light emitting device structures probed by X-ray specular reflectivity
P. Fenter, F. Schreiber, V. Bulović, S.R. ForrestVolume:
277
Year:
1997
Language:
english
Pages:
6
DOI:
10.1016/s0009-2614(97)00941-x
File:
PDF, 426 KB
english, 1997