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Enhanced Infrared Normal Spectral Emissivity of Microstructured Silicon at 100 to 200°C
Feng, Guo Jin, Wang, Yu, Li, Yuan, Guo, Ting TingVolume:
295-297
Language:
english
Journal:
Advanced Materials Research
DOI:
10.4028/www.scientific.net/AMR.295-297.886
Date:
July, 2011
File:
PDF, 1.79 MB
english, 2011