Structural Defect Studies of Semiconductor Crystals with Laue Topography
Gröschel, Alexander, Will, Johannes, Bergmann, Christoph, Grillenberger, Hannes, Eichler, Stefan, Scheffer Czygan, Max, Magerl, AndreasVolume:
178-179
Language:
english
Journal:
Solid State Phenomena
DOI:
10.4028/www.scientific.net/SSP.178-179.360
Date:
August, 2011
File:
PDF, 5.79 MB
english, 2011