Structural Defect Studies of Semiconductor Crystals with...

Structural Defect Studies of Semiconductor Crystals with Laue Topography

Gröschel, Alexander, Will, Johannes, Bergmann, Christoph, Grillenberger, Hannes, Eichler, Stefan, Scheffer Czygan, Max, Magerl, Andreas
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Volume:
178-179
Language:
english
Journal:
Solid State Phenomena
DOI:
10.4028/www.scientific.net/SSP.178-179.360
Date:
August, 2011
File:
PDF, 5.79 MB
english, 2011
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