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Effects of Cu stoichiometry on the microstructure, electrical conduction, and dielectric responses of Y2/3Cu3Ti4O12
Liang, Pengfei, Li, Fuchao, Chao, Xiaolian, Yang, ZupeiVolume:
41
Language:
english
Journal:
Ceramics International
DOI:
10.1016/j.ceramint.2015.05.089
Date:
November, 2015
File:
PDF, 1.16 MB
english, 2015