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Characterisation and modelling of noise parameters of SiC MESFETs
Eriksson, J., Rorsman, N., Nilsson, P.-A., Zirath, H.Volume:
35
Year:
1999
Language:
english
Journal:
Electronics Letters
DOI:
10.1049/el:19990426
File:
PDF, 266 KB
english, 1999