Nano-hardness estimation by means of Ar+ ion etching

Thin Solid Films 2015 / 08 Vol. 589

Nano-hardness estimation by means of Ar+ ion etching

Bartali, R., Micheli, V., Gottardi, G., Vaccari, A., Safeen, M.K., Laidani, N.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
589
Language:
english
Journal:
Thin Solid Films
DOI:
10.1016/j.tsf.2015.05.023
Date:
August, 2015
File:
PDF, 464 KB
english, 2015
Conversion to is in progress
Conversion to is failed