Monolayer X-ray reflectometry at the air–water interface

Chemical Physics Letters 1998 Vol. 295; Iss. 3

Monolayer X-ray reflectometry at the air–water interface

Hitoshi Yamaoka, Hideki Matsuoka, Keitaro Kago, Hitoshi Endo, John Eckelt, Ryuji Yoshitome
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Volume:
295
Year:
1998
Language:
english
Pages:
4
DOI:
10.1016/s0009-2614(98)00964-6
File:
PDF, 254 KB
english, 1998
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