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Ellipsometric analysis of Cd 1− x Zn x Se thin films prepared by a thermal evaporation technique
Mahmood, Arshad, R, Shaista, Shah, A, Aziz, U, Ahmed, E, Ali, S, Raza, QVolume:
83
Language:
english
Journal:
Physica Scripta
DOI:
10.1088/0031-8949/83/06/065706
Date:
June, 2011
File:
PDF, 1.14 MB
english, 2011