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SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - Seattle, WA (Sunday 7 July 2002)] Surface Scattering and Diffraction for Advanced Metrology II - Reflectivity of the AL-N coating: results of mechanical and environmental tests
Anisimov, Vladimir P., Anisimova, Irina A., Kashirin, Victor A., Moldosanov, Kamil A., Skrynnikov, Alexander M., Gu, Zu-Han, Maradudin, Alexei A.Volume:
4780
Year:
2002
Language:
english
DOI:
10.1117/12.452311
File:
PDF, 198 KB
english, 2002