In Situ Observation of Oxide Films Formed during Thermal...

Key Engineering Materials 1996 Vol. 113

In Situ Observation of Oxide Films Formed during Thermal Oxidation of SiC-B4C Composite Using Raman Spectroscopy

Narushima, Takayuki, Maruyama, M., Arashi, H., Goto, Takashi, Hirai, Toshio, Iguchi, Yasutaka
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Volume:
113
Year:
1996
Journal:
Key Engineering Materials
DOI:
10.4028/www.scientific.net/KEM.113.99
File:
PDF, 403 KB
1996
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