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ECS Transactions [ECS China Semiconductor Technology International Conference 2011 (CSTIC 2011) - Shanghai, China (March 13 - March 14, 2011)] - High Voltage Device Negative Bias Temperature Instability Improvement with Different Process Conditions
Sim, Poh Ching, Koo, Sang Sool, Pal, Deb KumarYear:
2011
Language:
english
DOI:
10.1149/1.3567700
File:
PDF, 146 KB
english, 2011