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A New Method for Electronic Circuit Fault Knowledge Acquisition Using PSPICE
Ding, Guo Bao, Huo, Zhi Cheng, Wang, Lian Bing, Li, DanVolume:
753-755
Language:
english
Journal:
Advanced Materials Research
DOI:
10.4028/www.scientific.net/AMR.753-755.2511
Date:
August, 2013
File:
PDF, 361 KB
english, 2013