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A Family of New Generation Miniaturized Impedance Analyzers for Technical Object Diagnostics
Hoja, Jerzy, Lentka, GrzegorzVolume:
20
Language:
english
Journal:
Metrology and Measurement Systems
DOI:
10.2478/mms-2013-0004
Date:
January, 2013
File:
PDF, 1.17 MB
english, 2013