New Photothermal Deflection Method to Determine Thermal Properties of Bulk Semiconductors
Gaied, Imen, Lassoued, Salima, Genty, Fredéric, Yacoubi, NoureddineVolume:
297-301
Language:
english
Journal:
Defect and Diffusion Forum
DOI:
10.4028/www.scientific.net/DDF.297-301.525
Date:
April, 2010
File:
PDF, 349 KB
english, 2010