New Photothermal Deflection Method to Determine Thermal...

New Photothermal Deflection Method to Determine Thermal Properties of Bulk Semiconductors

Gaied, Imen, Lassoued, Salima, Genty, Fredéric, Yacoubi, Noureddine
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Volume:
297-301
Language:
english
Journal:
Defect and Diffusion Forum
DOI:
10.4028/www.scientific.net/DDF.297-301.525
Date:
April, 2010
File:
PDF, 349 KB
english, 2010
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