Research on Temperature Stress for Contacts Reliability of...

Research on Temperature Stress for Contacts Reliability of Electric Connector

Du, Yong Ying, Sun, Zhi Li
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Volume:
945-949
Language:
english
Journal:
Advanced Materials Research
DOI:
10.4028/www.scientific.net/AMR.945-949.1082
Date:
June, 2014
File:
PDF, 279 KB
english, 2014
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