SPIE Proceedings [SPIE NDE for Health Monitoring and...

  • Main
  • SPIE Proceedings [SPIE NDE for Health...

SPIE Proceedings [SPIE NDE for Health Monitoring and Diagnostics - San Diego, CA (Sunday 14 March 2004)] Testing, Reliability, and Application of Micro- and Nano-Material Systems II - Introduction to EBSD analysis of micro- to nanoscale microstructures in metals and ceramics

Sitzman, Scott D., Meyendorf, Norbert, Baaklini, George Y., Michel, Bernd
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
5392
Year:
2004
Language:
english
DOI:
10.1117/12.542082
File:
PDF, 1.64 MB
english, 2004
Conversion to is in progress
Conversion to is failed