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SPIE Proceedings [SPIE NDE for Health Monitoring and Diagnostics - San Diego, CA (Sunday 14 March 2004)] Testing, Reliability, and Application of Micro- and Nano-Material Systems II - Introduction to EBSD analysis of micro- to nanoscale microstructures in metals and ceramics
Sitzman, Scott D., Meyendorf, Norbert, Baaklini, George Y., Michel, BerndVolume:
5392
Year:
2004
Language:
english
DOI:
10.1117/12.542082
File:
PDF, 1.64 MB
english, 2004