Mechanisms for Defect Creation and Removal in Hydrogenated and Deuterated Amorphous Silicon Studied using Thin Film Transistors
Flewitt, Andew, Lin, Shufan, Milne, William I, Wehrspohn, Ralf B, Powell, Martin JVolume:
910
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/PROC-0910-A19-01
Date:
January, 2006
File:
PDF, 373 KB
english, 2006