Accumulation of VO Defects in N-Si at High-Temperature...

Solid State Phenomena 2011 / 8 Vol. 178-179

Accumulation of VO Defects in N-Si at High-Temperature Pulse Electron Irradiation: Generation and Annealing Kinetics, Dependence on Irradiation Intensity

Kras'ko, Mykola, Kraitchinskii, Anatolii, Kolosiuk, Andrii, Neimash, Volodymyr, Voitovych, Vasyl, Makara, V.A., Petrunya, Ruslan, Povarchuk, Vasyl
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Volume:
178-179
Language:
english
Journal:
Solid State Phenomena
DOI:
10.4028/www.scientific.net/SSP.178-179.404
Date:
August, 2011
File:
PDF, 335 KB
english, 2011
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