![](/img/cover-not-exists.png)
[ACM Press the 33rd Annual ACM Conference - Seoul, Republic of Korea (2015.04.18-2015.04.23)] Proceedings of the 33rd Annual ACM Conference on Human Factors in Computing Systems - CHI '15 - On the Effectiveness of Pattern Lock Strength Meters
Song, Youngbae, Cho, Geumhwan, Oh, Seongyeol, Kim, Hyoungshick, Huh, Jun HoYear:
2015
Language:
english
DOI:
10.1145/2702123.2702365
File:
PDF, 9.12 MB
english, 2015