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Stress Liner Proximity Technique to Enhance Carrier Mobility in High-κ Metal Gate MOSFETs
Guo, Dechao, Schonenberg, Kathryn, Chen, Jie, Jaeger, Daniel, Kulkarni, Pranita, Kwon, Unoh, Liang, Yue, Liu, Joyce, Song, Liyang, Arnaud, Franck, Bu, Huiming, Chudzik, Michael, Henson, William K, OldVolume:
1194
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/PROC-1194-A04-02
Date:
January, 2009
File:
PDF, 310 KB
english, 2009