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SPIE Proceedings [SPIE IS&T/SPIE Electronic Imaging - Burlingame, California (Sunday 22 January 2012)] Image Processing: Algorithms and Systems X; and Parallel Processing for Imaging Applications II - Multi-resolution analysis for region of interest extraction in thermographic nondestructive evaluation
Ortiz-Jaramillo, B., Fandiño Toro, H. A., Benitez-Restrepo, H. D., Orjuela-Vargas, S. A., Castellanos-Domínguez, G., Philips, W., Egiazarian, Karen O., Agaian, Sos S., Gotchev, Atanas P., Recker, JohnVolume:
8295
Year:
2012
Language:
english
DOI:
10.1117/12.912079
File:
PDF, 985 KB
english, 2012