SPIE Proceedings [SPIE IS&T/SPIE 1994 International Symposium on Electronic Imaging: Science and Technology - San Jose, CA (Sunday 6 February 1994)] Machine Vision Applications in Industrial Inspection II - Finish inspection by vision for glass production
Canivet, Michel, Zhang, Ruo Dan, Jourlin, Michel, Dawson, Benjamin M., Wilson, Stephen S., Wu, Frederick Y.Volume:
2183
Year:
1994
Language:
english
DOI:
10.1117/12.171206
File:
PDF, 219 KB
english, 1994