The characterization of Electronic state from Surface to Several Nanometer Region on MgO:Si Thin Film
Nishitani, Mikihiko, Fukada, Mutsumu, Morita, Yukihiro, Terauchi, Masaharu, Kurashiki, Tessei, Tsuchiura, Hiroki, Yamauchi, YasushiVolume:
1406
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/opl.2012.29
Date:
January, 2012
File:
PDF, 218 KB
english, 2012