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Determination of Defects Concentration from C-V and G-V Curves in a MOSFET Structure
Abboud, Nadine, Habchi, RolandVolume:
1195
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/PROC-1195-B14-05
Date:
January, 2009
File:
PDF, 470 KB
english, 2009