Characterization and Aging Test Methodology for Power...

Advanced Materials Research 2011 / 8 Vol. 324

Characterization and Aging Test Methodology for Power Electronic Devices at High Temperature

Ibrahim, Ali, Khatir, Zoubir, Dupont, Laurent
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Volume:
324
Language:
english
Journal:
Advanced Materials Research
DOI:
10.4028/www.scientific.net/AMR.324.411
Date:
August, 2011
File:
PDF, 3.17 MB
english, 2011
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