Electronic Speckle Pattern Interferometry with Optimum...

Electronic Speckle Pattern Interferometry with Optimum Image Extraction for Deformation Measurement under Environmental Disturbance

ARIKAWA, Shuichi, NAKAYA, Yusuke, YONEYAMA, Satoru
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Volume:
6
Year:
2012
Language:
english
Journal:
Journal of Solid Mechanics and Materials Engineering
DOI:
10.1299/jmmp.6.634
File:
PDF, 1.92 MB
english, 2012
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