Electronic Speckle Pattern Interferometry with Optimum Image Extraction for Deformation Measurement under Environmental Disturbance
ARIKAWA, Shuichi, NAKAYA, Yusuke, YONEYAMA, SatoruVolume:
6
Year:
2012
Language:
english
Journal:
Journal of Solid Mechanics and Materials Engineering
DOI:
10.1299/jmmp.6.634
File:
PDF, 1.92 MB
english, 2012