![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE Sixth International Symposium on Precision Engineering Measurements and Instrumentation - Hangzhou, China (Sunday 8 August 2010)] Sixth International Symposium on Precision Engineering Measurements and Instrumentation - Analysis of electrical tomography sensitive field based on multi-terminal network and electric field
He, Yongbo, Su, Xingguo, Xu, Meng, Wang, Huaxiang, Tan, Jiubin, Wen, XianfangVolume:
7544
Year:
2010
Language:
english
DOI:
10.1117/12.885608
File:
PDF, 319 KB
english, 2010