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Forward Bias Capacitance-Voltage Measurements on Semiconductors Using Co-Planar Ohmic and Schottky Contacts in a Cylindrical Geometry
Rangel-Kuoppa, Victor Tapio, Sopanen, Markku, Lipsanen, HarriVolume:
12
Language:
english
Journal:
Journal of Nano Research
DOI:
10.4028/www.scientific.net/JNanoR.12.45
Date:
December, 2010
File:
PDF, 309 KB
english, 2010