Materials Characterization using THz Ellipsometry
Hofmann, Tino, Herzinger, Craig M., Woollam, John A., Schubert, MathiasVolume:
1163
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/PROC-1163-K08-04
Date:
January, 2009
File:
PDF, 104 KB
english, 2009