Ellipsometry Study on Nanoparticles Grown by Atomic Layer...

MRS Proceedings 2013 Vol. 1548

Ellipsometry Study on Nanoparticles Grown by Atomic Layer Deposition

Zhou, Xueqi, Zhang, Ying, Dong, Zhengqiong, Liu, Shiyuan, Zhang, Chuanwei, Huang, Bin, Cao, Kun, Shan, Bin, Chen, Rong
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Volume:
1548
Year:
2013
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/opl.2013.847
File:
PDF, 702 KB
english, 2013
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