SPIE Proceedings [SPIE Optical Metrology - Munich, Germany...

  • Main
  • SPIE Proceedings [SPIE Optical...

SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 13 June 2005)] Nano- and Micro-Metrology - Two-dimensional power spectral density measurements of x-ray optics with the Micromap interferometric microscope

Yashchuk, Valeriy V., Franck, Andrew D., Irick, Steve C., Howells, Malcolm R., MacDowell, Alastair A., McKinney, Wayne R., Ottevaere, Heidi, DeWolf, Peter, Wiersma, Diederik S.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
5858
Year:
2005
Language:
english
DOI:
10.1117/12.612383
File:
PDF, 3.19 MB
english, 2005
Conversion to is in progress
Conversion to is failed