Microstructure and Defects Evaluation of Varistors by...

Microstructure and Defects Evaluation of Varistors by Ultrasonic Waves in Low Frequency Range

Tofel, Pavel, Škarvada, Pavel, Sikula, Josef, Cséfalvay, Gabriel
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Volume:
592-593
Language:
english
Journal:
Key Engineering Materials
DOI:
10.4028/www.scientific.net/KEM.592-593.688
Date:
November, 2013
File:
PDF, 476 KB
english, 2013
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