Measured Scan Data Reduction Combination Algorithm Based on Scan Line
Wang, Shi Gang, Yan, Yong, Wang, Feng JuanVolume:
651-653
Language:
english
Journal:
Applied Mechanics and Materials
DOI:
10.4028/www.scientific.net/AMM.651-653.2335
Date:
September, 2014
File:
PDF, 353 KB
english, 2014