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Atomically Resolved Imaging of Epitaxial CaF2 on Si(111) using Noncontact Atomic Force Microscope
Seino, Yoshihide, Abe, Masayuki, Morita, SeizoVolume:
838
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/PROC-838-O1.9
Date:
January, 2004
File:
PDF, 545 KB
english, 2004