SPIE Proceedings [SPIE Lasers in Metrology and Art...

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SPIE Proceedings [SPIE Lasers in Metrology and Art Conservation - Munich, Germany (Monday 18 June 2001)] Recent Developments in Traceable Dimensional Measurements - Portable I2-stabilized Nd:YVO4/KTP laser for secondary wavelength standards at 532 nm

Chartier, Jean-Marie, Vitushkin, Leonid F., Khaleyev, Mikhail, Novikov, Georgii E., Orlov, Oleg A., Terekhov, Sergey, Ustugov, Vladimir I., Decker, Jennifer E., Brown, Nicholas
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Volume:
4401
Year:
2001
Language:
english
DOI:
10.1117/12.445629
File:
PDF, 157 KB
english, 2001
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