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SPIE Proceedings [SPIE SPIE Optics + Optoelectronics - Prague, Czech Republic (Monday 13 April 2015)] EUV and X-ray Optics: Synergy between Laboratory and Space IV - Diffraction gratings based on asymmetric-cut multilayers
Hudec, René, Pina, Ladislav, Prasciolu, Mauro, Chapman, Henry N., Bajt, SašaVolume:
9510
Year:
2015
Language:
english
DOI:
10.1117/12.2178246
File:
PDF, 661 KB
english, 2015