![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE Optical Tools for Manufacturing and Advanced Automation - Boston, MA (Tuesday 7 September 1993)] Fiber Optics Reliability and Testing: Benign and Adverse Environments - Method of measuring optical fiber delay line used in a wideband radar system
Xu, Rongqing, Wang, Guolin, Cao, Zhidao, Paul, Dilip K., Yuce, Hakan H.Volume:
2074
Year:
1994
Language:
english
DOI:
10.1117/12.168640
File:
PDF, 187 KB
english, 1994