Investigation of Retention Properties for YMnO3 Based Metal/Ferroelectric/Insulator/Semiconductor Capacitors
Yoshimura, T., Ito, D., Sakata, H., Shigemitsu, N., Haratake, K., Ashida, A., Fujimura, N.Volume:
786
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/PROC-786-E9.7/C9.7
Date:
January, 2003
File:
PDF, 2.26 MB
english, 2003